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Rudolf HuberOffer
Ab dem 1. Oktober 2012 finden Sie uns im Nanocenter Dresden ...
We are a well known and reliable partner for all your questions about ANALYTICS.
Our experts are working with analytical methods over 15 years.
Originally many methods were developed for semiconductor applications.
Today over 150 methods exist and it will become more and more difficult to find the best and most favourable priced solution for the own application.
Preparation techniques
* surfaces
* layer- and depth profiles
* bulk analysis
* microstructures
* particles
* process components
* VPD (surface analysis - each diameter and surface)
* layer removals and layer analysis (up to 100µm)
* bulk preparation
* chemical extractions (incl. microwave)
Analysis methods
* TXRF, ICP-MS, ICP-OES
* SIMS, ToF-SIMS
* NAA
* EDX, WDX, XPS, AES
* electron microscopy (REM, TEM)
* Ion chromatography
* photometry
* FTIR infrared spectroscopy
* thermo analysis TGA, SC
* titration, determination of ph-values
* ultrapure waterinspections